UA3P
UA3P
Measuring Systems Ultrahigh accurate 3-D profilometer (UA3P)

Ultrahigh Accurate 3-D Profilometer UA3P Series

Designed to measure aspherical lenses & molds, freeform optics, mirrors and any other precision component requiring nanometer level accuracy
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Ultrahigh accurate 3-D profilometer (UA3P)

  • UA3P-3100
  • UA3P-4000
  • UA3P-5000H
  • UA3P-400T
  • UA3P-500H/550H
  • UA3P-650H
  • UA3P-700H
  • UA3P-300
  • UA3P-400

Main Features

  • Ultra-accurate measurement with highest stability
  • Automatic NC program generation
  • Extensive library of optional software

"It is impossible to manufacture parts without making measurements" - The UA3P series supports nanometer-accuracy manufacturing by making precise measurements of various fine shapes.

UA3P can measure aspheric lenses, free curved surface mirrors, and molds for processing them with a maximum accuracy of 0.01 μm. These lenses and mirrors are indispensable for digital home appliances such as smartphones, DSCs, DVDs, and Blu-ray devices, home security, optical communication, automotive HUDs, etc. UA3P allows easy operations to achieve rapid processing feedback.

Ultrahigh accurate 3-D profilometer (UA3P)

Strengths and Features

Introduction video of the "Ultrahigh Accurate 3-D Profilometer UA3P Series"

Measurement range of the Ultrahigh Accurate 3-D Profilometer UA3P Series

Measurement accuracy and application fields of various types of profilometers


Measurement accuracy and applicable field of each profilometer

Offering a full profilometer series lineup ranging from an ultra-high precision measurement of ±0.10 μm at a 70° tilt angle to the measurement of large parts with a 500 mm square area


Measurement area and accuracy by model


Measurement area and accuracy by model

A model that only allows side-surface measurement (UA3P-L) is also available.


Measured objects


Lenses for mobile devices Lens barrels DSLR lenses
fθ lenses X-ray telescope mirrors Molds for lenses
Camera lenses Molds for toric lenses Stepper lenses

Technology for realizing ultra-high precision measurements

Coordinate measurement technology


Coordinate measurement technology

The profilometer’s coordinate system is configured with three reference flat surfaces (mirrors) independent of the stages. The length of an object in each X, Y, and Z axis is measured to a resolution of 0.3 nm with the laser interference method using a He-Ne frequency-stabilized laser as a light source. This suppresses the influence of squareness and straightness of the stages to achieve high-precision measurement.

  • Measurement error due to coordinate axes
    0.05 µm max. (up to 100 mm)
    0.3 µm max. (up to 500 mm)
Coordinate measurement technology

Top surface measuring probe/AFP

High-precision scanning and measurement of a measured object is feasible due to the use of ultra-low measuring forces.
The stylus is held by a micro-air slider, and the focus laser detects the movement of the stylus. The position of the AFP is tracked in line with the shape of the measured object to keep the measuring force constant.

  • Measuring force: 0.15 to 0.30 mN (15 to 30 mgf)
    * UA3P-3000 applies a force of 0.10 to 0.20 mN.
  • Stylus: A diamond stylus with a tip angle of 30º and a radius of 2 µm can be used.
Top surface measuring probe/AFP

Side-surface measuring probe/S-AFP

The inclination of a probe mirror detected with high-precision is fed back to the XY stages to enable a scanning measurement with a low contact force (0.3 mN).
This enables measurement without deforming resin products, such as a lens cylinder (barrel).

  • Measuring force: 0.3 mN (30 mgf)
  • Measurement accuracy: ±0.15 µm (when measuring 90º inclination)
  • Maximum measurement angle
    Horizontal measurement: 45º to 90º (angle relative to the horizontal surface)
    Vertical measurement: 80º to 90º (angle relative to the horizontal surface)
Side-surface measuring probe/S-AFP

Software
Software

Achieving high-speed, high-precision measurement with a simple operation.
UA3P can support any design information and correct an installation error in a measured object in three dimensions to achieve an accurate profile measurement.


Top-side surface evaluation technology

By synthesizing the top-surface and side-surface data of a measured object, decentering and inclination of the optical axis of a lens or a mold can be evaluated with reference to the side surface.

Top-side surface evaluation technology

Main Specifications

UA3P-3100 UA3P-4000 UA3P-5000H UA3P-400T UA3P-500H/550H UA3P-650H UA3P-700H UA3P-300 UA3P-400
Outer dimensions(WXDXH) mm
760 x 860 x1580
1060 x 1200 x 1610
1300 x 1560 x 1900
1070 x 1230 x 1530
1260 x 1510 x 1580
2100 x 1830 x 2110
2100 x 1830 x 2200
700 x 800 x 1510
1010 x 1110 x 1450
Mass of main body
900kg (Others:200kg)
1500kg (Others:300kg)
3200kg(Others: 300kg)
750kg
2400kg (Others : 300kg)
8500kg (Others 300kg)
9000kg(Others:300kg)
700kg(Others:150kg)
1200kg(Others:150kg)
Measuring range(X,Y,Z axes) mm
3100-A30: 30 x 30 x 20
3100-A50: 50 x 50 x 20
4000-A100: 100 x 100 x 35
4000-A120: 120 x 120 x 35
200 X 200 X 50
100 x 100 x 50
200 x 200 x 45
UA3P-550H (+260 x 90 x 45)
400 x 400 x 120
+Φ500 x 120
500X500X 120
30 x 30 x 20
100 x 100 x 35
Measured object placement area (X,Y,Zaxes)mm
130 x 130 x 120
210 x 210 x 127.5
300 x 300 x 255
200 x 200 x 140
300 x 270 x 252.5
600 x 600 x 330
600 x 600 x 330
100 x 100 x 120
220 x 220 x 132
Resolution
0.3 nm
0.3 nm
0.3 nm
0.3 nm
0.3 nm
0.3 nm
0.3 nm
0.3 nm
0.3 nm
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